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Test & Measurement

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20 August 2008 15:14

Keithley Expands MIMO RF Measurement Capabilities with Industry’s First 8x8 MIMO Test System

Keithley Instruments, a leader in solutions for emerging measurement needs, is extending its lead in RF MIMO (multiple-input, multiple-output) test with the industry's first measurement-grade 8x8 MIMO system. The system is used for primary research of next-generation RF

19 August 2008 15:09

New Tutorial Poster for WiMAX Measurement from Keithley

Keithley Instruments, a leader in solutions for emerging measurement needs, has published a new poster that illustrates the key measurement tools and software analysis techniques required for measuring complex WiMAX signals. The poster is available at no charge

05 August 2008 14:00

CommAgility's high-performance signal processing AdvancedMC module selected by Aeroflex for LTE wireless test mobile

Aeroflex, a leading provider of specialised test and measurement equipment, has selected CommAgility's AMC-D4F1 module as a key component in its new TM500 LTE Test Mobile platform. Aeroflex chose the AMC-D4F1 because it provides DSP/FPGA performance and density

05 August 2008 13:55

Compact benchtop power analyser for single- and three-phase measurements

The new Yokogawa WT500 is a compact benchtop power analyser which can carry out DC or single- and three-phase AC measurements at voltages of up to 1000 V and currents up to 40 A.

02 June 2008 13:21

Agilent Technologies’ New Portable Radio Tester Saves Time, Training with One-Button Functionality at Operational, Intermediate Military Levels

Agilent Technologies has today introduced a rugged, portable radio tester that enables one-button testing of FM and SINCGARS (SINgle Channel Ground Air Radio System) radios at both the operational and intermediate military testing levels
     
The advanced diagnostics available

01 May 2008 13:49

Automated Characterization Suite (ACS) Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster

Keithley Instruments, a specialist in solutions for emerging measurement needs, has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds

21 April 2008 15:54

PC-based data-acquisition system combines high performance and ease of use

The new Yokogawa SL1000 is a PC-based data-acquisition unit designed to provide high-speed data logging and fast data transfer in electro-mechanical and power measurement applications.

18 February 2008 17:00

Aeroflex releases new RF spectrum analyzer option and P25 capabilities for the 3500 hand-held radio test set

Aeroflex has announced the release of a new RF spectrum analyzer option for the 3500 hand-held 1GHz radio test set. The new spectrum analyzer option now allows users to see the signal they are receiving instead of just

18 February 2008 10:59

TTi provides quick and reliable audio testing against limits

TTi has announced that the AP High Speed Tester (HST) application is now available for use with the Audio Precision AP2700 Series audio analyser.

31 January 2008 16:59

Agilent Technologies Unveils Industry’s First DDR2, DDR3 BGA Probe Solution for Oscilloscopes, Logic Analyzers

Agilent Technologies has today unveiled the industry's first DDR2 and DDR3 ball-grid array (BGA) probes for oscilloscopes and logic analyzers.
    
Dynamic random access memory (DRAM) data rates have increased significantly over the past few years. Hence,

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